The Error Correcting Code(ECC)is one of the most used hardening methods in Flash memory.In this study,the effect of ECC failure modes on memory error cross section has been investigated.The errors are counted in the s...The Error Correcting Code(ECC)is one of the most used hardening methods in Flash memory.In this study,the effect of ECC failure modes on memory error cross section has been investigated.The errors are counted in the situations of ECC function enabled and disabled separately after heavy ion irradiation.The results show that the upset cross section is a constant value in different ion fluences when the ECC function is disabled.With the ECC function enabled,the error cross section increases with the increase of ion fluences because the ECC failure modes lead to the increase in the number of errors.Moreover,all ECC failure modes are simulated,and their probability is calculated separately.The results help to understand the impact of ECC failure modes on Flash memory’s error cross section induced by irradiation.Some possible mitigation approaches are provided in response to this phenomenon.展开更多
纠错密码是一种利用纠错码体制来实现纠错和加密双重功能的一种密码体制。大部分已知的纠错密码从变换的角度看是一种对明文的线性变换。从密码分析的角度看,由于不具有非线性变换,密码的混淆能力不强,容易被攻击。利用纠错码(Error-Cor...纠错密码是一种利用纠错码体制来实现纠错和加密双重功能的一种密码体制。大部分已知的纠错密码从变换的角度看是一种对明文的线性变换。从密码分析的角度看,由于不具有非线性变换,密码的混淆能力不强,容易被攻击。利用纠错码(Error-Correction Code,ECC)改造基本HFE(Hidden Field Equations)密码算法,所得的新密码算法具有纠错和加密功能,而且因其具有概率密码特性以及建立在MQ困难问题之上,具有很高的安全强度。展开更多
In deep sub-micron ICs, growing amounts of on-die memory and scaling effects make embedded memories more vulnerable to reliability problems, such as soft errors induced by radiation. Error Correction Code(ECC) along w...In deep sub-micron ICs, growing amounts of on-die memory and scaling effects make embedded memories more vulnerable to reliability problems, such as soft errors induced by radiation. Error Correction Code(ECC) along with scrubbing is an efficient method for protecting memories against these errors. However, the latency of coding circuits brings speed penalties in high performance applications. This paper proposed a "bit bypassing" ECC protected memory by buffering the encoded data and adding an identifying address for the input data. The proposed memory design has been fabricated on a 130 nm CMOS process. According to the measurement, the proposed scheme only gives the minimum delay overhead of 22.6%, compared with other corresponding memories. Furthermore, heavy ion testing demonstrated the single event effects performance of the proposed memory achieves error rate reductions by 42.9 to 63.3 times.展开更多
代码异味是由糟糕的代码或设计问题引起的一种软件特征,严重影响了软件系统的可靠性和可维护性.在软件系统中,一段代码元素可能同时受到多种代码异味的影响,使得软件质量明显下降.多标签分类适用该情况,将高共现的多个代码异味置于同一...代码异味是由糟糕的代码或设计问题引起的一种软件特征,严重影响了软件系统的可靠性和可维护性.在软件系统中,一段代码元素可能同时受到多种代码异味的影响,使得软件质量明显下降.多标签分类适用该情况,将高共现的多个代码异味置于同一标签组,可以更好地考虑代码异味的相关性,但现有的多标签代码异味检测方法未考虑同一段代码元素中多种代码异味检测顺序的影响.对此,提出了一种基于排序损失的集成分类器链(ensemble of classifier chains,ECC)多标签代码异味检测方法,该方法选择随机森林作为基础分类器并采取多次迭代ECC的方式,以排序损失最小化为目标,选择一个较优的标签序列集,优化代码异味检测顺序问题,模拟其生成机理,检测一段代码元素是否同时存在长方法长参数列表、复杂类消息链或消息链过大类这3组代码异味.实验采用9个评价指标,结果表明所提出的检测方法优于现有的多标签代码异味检测方法,F1平均值达97.16%.展开更多
Three-party password authenticated key exchange (3PAKE) protocol plays a significant role in the history of secure communication area in which two clients agree a robust session key in an authentic manner based on pas...Three-party password authenticated key exchange (3PAKE) protocol plays a significant role in the history of secure communication area in which two clients agree a robust session key in an authentic manner based on passwords. In recent years, researchers focused on developing simple 3PAKE (S-3PAKE) protocol to gain system e?ciency while preserving security robustness for the system. In this study, we first demonstrate how an undetectable on-line dictionary attack can be successfully applied over three existing S-3PAKE schemes. An error correction code (ECC) based S-3PAKE protocol is then introduced to eliminate the identified authentication weakness.展开更多
摘要The Error Correcting Code(ECC)is one of the most used hardening methods in Flash memory.In this study,the effect of ECC failure modes on memory error cross section has been investigated.The errors are counted in the situations of ECC function enabled and disabled separately after heavy ion irradiation.The results show that the upset cross section is a constant value in different ion fluences when the ECC function is disabled.With the ECC function enabled,the error cross section increases with the increase of ion fluences because the ECC failure modes lead to the increase in the number of errors.Moreover,all ECC failure modes are simulated,and their probability is calculated separately.The results help to understand the impact of ECC failure modes on Flash memory’s error cross section induced by irradiation.Some possible mitigation approaches are provided in response to this phenomenon.
摘要纠错密码是一种利用纠错码体制来实现纠错和加密双重功能的一种密码体制。大部分已知的纠错密码从变换的角度看是一种对明文的线性变换。从密码分析的角度看,由于不具有非线性变换,密码的混淆能力不强,容易被攻击。利用纠错码(Error-Correction Code,ECC)改造基本HFE(Hidden Field Equations)密码算法,所得的新密码算法具有纠错和加密功能,而且因其具有概率密码特性以及建立在MQ困难问题之上,具有很高的安全强度。
基金Supported by the National Science and Technology Major Project of China(No.2013ZX03006004)
摘要In deep sub-micron ICs, growing amounts of on-die memory and scaling effects make embedded memories more vulnerable to reliability problems, such as soft errors induced by radiation. Error Correction Code(ECC) along with scrubbing is an efficient method for protecting memories against these errors. However, the latency of coding circuits brings speed penalties in high performance applications. This paper proposed a "bit bypassing" ECC protected memory by buffering the encoded data and adding an identifying address for the input data. The proposed memory design has been fabricated on a 130 nm CMOS process. According to the measurement, the proposed scheme only gives the minimum delay overhead of 22.6%, compared with other corresponding memories. Furthermore, heavy ion testing demonstrated the single event effects performance of the proposed memory achieves error rate reductions by 42.9 to 63.3 times.
摘要代码异味是由糟糕的代码或设计问题引起的一种软件特征,严重影响了软件系统的可靠性和可维护性.在软件系统中,一段代码元素可能同时受到多种代码异味的影响,使得软件质量明显下降.多标签分类适用该情况,将高共现的多个代码异味置于同一标签组,可以更好地考虑代码异味的相关性,但现有的多标签代码异味检测方法未考虑同一段代码元素中多种代码异味检测顺序的影响.对此,提出了一种基于排序损失的集成分类器链(ensemble of classifier chains,ECC)多标签代码异味检测方法,该方法选择随机森林作为基础分类器并采取多次迭代ECC的方式,以排序损失最小化为目标,选择一个较优的标签序列集,优化代码异味检测顺序问题,模拟其生成机理,检测一段代码元素是否同时存在长方法长参数列表、复杂类消息链或消息链过大类这3组代码异味.实验采用9个评价指标,结果表明所提出的检测方法优于现有的多标签代码异味检测方法,F1平均值达97.16%.
基金the National Science Council (Nos. NSC 99-2218-E-011-014 and NSC 100-2219-E-011-002)
摘要Three-party password authenticated key exchange (3PAKE) protocol plays a significant role in the history of secure communication area in which two clients agree a robust session key in an authentic manner based on passwords. In recent years, researchers focused on developing simple 3PAKE (S-3PAKE) protocol to gain system e?ciency while preserving security robustness for the system. In this study, we first demonstrate how an undetectable on-line dictionary attack can be successfully applied over three existing S-3PAKE schemes. An error correction code (ECC) based S-3PAKE protocol is then introduced to eliminate the identified authentication weakness.